On-Demand Webinars
On-Demand Webinars
Introducing Hach’s MET ONE Compliant Workflow System™
for Paperless Air Monitoring Powered by MODA
| Format: | Interactive/Lecture |
| Guest Speaker: | Scott Hjelmervik, Systems Director, Hach |
| Facilitator: | Bob Toal, MODA |
Overview
To automate Environmental Monitoring (EM) for air particle monitoring, Hach is introducing the MET ONE Compliance Workflow System™ (MET ONE CWS™) powered by MODA. By integrating the data acquisition, workflow and analytics capabilities of the MODA-EM™ platform with Hach’s industry leading MET ONE 3400 series of portable air particle counters, MET ONE CWS provides a paperless solution for air particle monitoring of cleanroom environments. The unit delivers new levels of efficiency because results are immediately captured as each test is performed, completely eliminating the need for the labor-intensive paper tape output and manual transcription. QA/QC personnel and facilities and control engineers will now be able to fully automate their cleanroom certification and EM regimens for air particulate testing.
Live Demonstration Featuring
• Air particle monitoring in the pharmaceutical industry
• Paper-based vs. paperless air particle monitoring processes
• Demo of MET ONE CWS
• Upgrade path to MODA-EM’s paperless solution
• Real-time Q&A with Hach subject expert
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